• Same Proven Technology as all 5000 Series Testers
• High Speed Single Test Measure
• Capable of Testing Multiple and Mixed Devices
• 1KV Standard, 2KV Optional
• 1NA to 50A Standard, 100A Optional
• 0.1NA Resolution
• Complete Self Test
• Auto-Calibration
• RDSON to 0.1MOHM Resolution
• Windows® Application Software
• Optional Scanner
• Optional Wafer Mapping
• Optional Curve Trace
• MOSFET, IGBT, J-FET
  Triac, SCR, Sidac, Diac, Quadrac, STS, SBS
  Transistor, Diode, Opto, Zener
  Regulator, MOV, Relay
• Fast Data Capture

5000E Brochure