The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. With an on-board SBC,the tester can provide high-speed, stand alone (after test program download) testing capability; or, when connected to a PC, provide intuitive test development and data capture including optional curve trace and wafer mapping.

Model 5300HX vs. Model 5000E

• Table of Tests
• Specifications
• Built-In Self Test
• Built-In Auto Calibration
• Autopolarity (Diodes)
• Programmable Relay Drivers
• 96 Programmable Test Steps
• 99 Sorts
• Sort Qualify on Pass or Fail
• Branch on Non-Qualifying Test
• Windows®Application Software

• Current Ranges:
  • Standard: 1.0nA - 50A
  • Mainframe Extension to 100A
  • Low Current Option: 20pA
  • High Current Options: up to 1200A
• Voltage Ranges:
  • Standard (Anode): 10mV - 1000V
  • 2000V with 2KV Anode Option
  • Standard (Gate) : 10mV - 20V
  • 80V with 80V Gate Option
• High Speed ADC (Single Test Measurement)
• Fast Data Capture
• Handler Interface (16 Logical Bins)

5300HX Buyer's Guide