SCIENTIFIC TEST, INC.,Semiconductor Testers and Automated Semiconductor Testers (ATE)


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WAFER MAPPING

Scientific Test, Inc. has developed the tools to obtain the XY wafer coordinates from the prober and incorporate them into the Datalog data file. With this information, the STI Windows software can create wafer maps based on:

Bin Result (up to 16 logical bins plus fail)
Sort Result (up to 16 sorts plus fail)
Parametric Test Data (up to 16 divisions)

Colors for each Bin, Sort or Parametric division are user selectable. Die size is user settable. Each map can have up to three lines of up to fifty characters each in the title. Each configuration (including type of map, colors, die size, title) can be saved and recalled, making the process of creating a wafer map easier. Each map created can be printed or saved to a file.

PRODUCT OVERVIEW

test equipment, automatic test equipment, discrete semiconductor test equipment, automatic discrete semiconductor tester, semiconductor ate, discrete semiconductor ate, discrete semiconductor tester, automatic discrete semiconductor tester, transistor tester, triac tester, diode tester, ssovp tester, mosfet tester, scr tester, zener tester, varistor tester, sidac tester, relay tester, ovp tester, dual ovp tester, gated ovp tester, Breakdown Voltage, Leakage Current, Current Gain, HFE, RDS, VF, Forward Voltage, ICBO, IEBO, ICES, ICER, IR, BVCBO, BVEBO, BVCES, BVCER, BVR, BVZ, ZZ, VCESAT, VBESAT, VBEON, VDS, IDSS, IGSS, ICER, BVGSS, BVDSS, IGT, VGT, VT, IH, IR, STI 5300, STI 5150, ATE, SSOUP, TVS, Curve Tracer, STI 5300HS


	Scientific Test, Inc. 1110 E. Collins Blvd., #130 Richardson, TX 75081 972.479.1300 Copyright © 2010 Scientific Test, Inc. \| Privacy Policy