|
Scientific Test, Inc. has developed the tools to obtain the XY wafer coordinates from the prober and incorporate them into the Datalog data file. With this information, the STI Windows software can create wafer maps based on:
- Bin Result (up to 16 logical bins plus fail)
- Sort Result (up to 16 sorts plus fail)
- Parametric Test Data (up to 16 divisions)
Colors for each Bin, Sort or Parametric division are user selectable. Die size is user settable. Each map can have up to three lines of up to fifty characters each in the title. Each configuration (including type of map, colors, die size, title) can be saved and recalled, making the process of creating a wafer map easier. Each map created can be printed or saved to a file. |
|
|
