SCIENTIFIC TEST, INC.,Semiconductor Testers and Automated Semiconductor Testers (ATE)

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STI's ADVANCED WIN PC SOFTWARE

STI's Advanced WIN PC Software

WIN95/98/XP/NT/2000®© Compatible

High speed datalog capture to PC (Serial and USB to 115KBaud)

Datalog capture directly into Microsoft Excel Spreadsheet

Real time math for Delta, Gain, Transconductance, Hysteresis and other computations

Hi Rel "Delta On The Fly" and Retest Capabilities

Wafer Mapping using Bin or Sort result or test parameter result

True parameter substitution including computations

Real time Lot Summary

Multiple screens with Multiplex

Bin Sort with branching and qualification on Pass or Fail

Up to 96 tests

Up to 99 sorts assignable to any of 16 bins

And much more......

Try Demo Software

Windows® is a registered trademark or trademark of Microsoft Corporation

in the United States and/or other countries.

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