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STI's ADVANCED WIN PC SOFTWARE


STI's Advanced WIN PC Software

WIN95/98/XP/NT/2000®© Compatible

High speed datalog capture to PC (Serial and USB to 115KBaud)
Datalog capture directly into Microsoft Excel Spreadsheet
Real time math for Delta, Gain, Transconductance, Hysteresis and other computations
Hi Rel "Delta On The Fly" and Retest Capabilities
Wafer Mapping using Bin or Sort result or test parameter result
True parameter substitution including computations
Real time Lot Summary
Multiple screens with Multiplex
Bin Sort with branching and qualification on Pass or Fail
Up to 96 tests
Up to 99 sorts assignable to any of 16 bins
And much more......

 

Try Demo Software

Windows® is a registered trademark or trademark of Microsoft Corporation

in the United States and/or other countries.


Scientific Test, Inc. 1110 E. Collins Blvd., #130 Richardson, TX 75081 972.479.1300
Copyright © 2006 Scientific Test, Inc.

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